The SENTERRA II is designed to deliver excellent sensitivity with high spectral resolution, rapid mapping/imaging, and fully automated OQ/PQ validation.
The myriad of new technologies and enabling solutions on display are driving research and offering promise for the ever-quickening pace of discovery.
Benchtop scanning electron microscopes address size efficiency without sacrificing features that make the technology powerful for many research applications.
Microscope Parts: Popular Components, Add-ons, and Replacement Parts for Brightfield and Fluorescence Microscopes
The variety and functional significance of components, add-ons, and parts available for various microscopy platforms are briefly reviewed in this post.